Oxford Instruments has introduced a comprehensive update of its operating system for Raman and correlative microscopes. WITec Suite SEVEN brings DataTrace, an Enhanced Project Manager, Spectral Certification and Advanced Cosmic Ray Removal to the measurement control and data analysis platform.
Image Credit: WITec GmbH
DataTrace stores all measurement settings and data processing steps, including algorithm parameters, the record of which data objects are derived from others, and username and time stamps for each action. A meta info viewer shows an experiment’s complete history, including searches and exports of parameters. These new capabilities help make experiments repeatable and results reproducible.
Enhanced Project Manager is an evolution of the software’s data object window that includes a new tool bar with search, a color-coded hierarchical display of data objects, and the ability to selectively hide objects. This offers a more streamlined overview of complex investigations.
Spectral Certification uses the spectrum of a reference sample to verify system calibration with standardized data. The certified spectra are then labelled as such with a symbol in the software, which is convenient when working in multi-user facilities and certain regulatory environments.
Advanced Cosmic Ray Removal can excise artifacts of high energy particles that hit the detector. Multiple cosmic rays, very wide artifacts, and those that are closely adjacent or partially obscuring Raman peaks can be removed from datasets to aid measurements with very long acquisition times.
WITec Suite SEVEN’s features contribute to making an already powerful software environment more transparent, intuitive and precise. These developments provide researchers with tools to extract the best performance from their microscopes and the clearest insights from their data.
Explore WITec Suite SEVEN.
